Versatile, rapid and robust nano-positioning of single-photon emitters by AFM-nanoxerography
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DOI: 10.1088/1361-6528/ac50f1
Abstract: Atomic force microscopy (AFM) nanoxerography was successfully used to direct the assembly of colloidal nanodiamonds (NDs) containing nitrogen-vacancy (NV) centres on electrostatically patterned surfaces. This study reveals that the number of deposited NDs can be… read more here.
Keywords: afm nanoxerography; single photon; nano positioning; versatile rapid ... See more keywords