Intensity dependent deflection spectroscopy for the characterization of absorption mechanisms in semiconductors
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DOI: 10.1063/5.0012702
Abstract: We report on a simple method for the characterization of optical absorption in semiconductors at photon energies below the bandgap energy. Therefore, we perform spatially resolved and intensity dependent deflection spectroscopy to measure the local… read more here.
Keywords: absorption; intensity dependent; deflection spectroscopy; spectroscopy ... See more keywords