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Published in 2021 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2021.113291
Abstract: Nano-porous materials can be imaged spatially by focused ion beam scanning electron microscopy (FIB-SEM). This method generates a stack of SEM images that has to be segmented (or reconstructed) to serve as basis for structural…
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Keywords:
image;
fib sem;
porous structures;
reconstructing porous ... See more keywords