"Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)"

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Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)

Author(s): Zhao, Peida; Wang, Ruixuan; Lien, Der‐Hsien; Zhao, Yingbo; Kim, Hyungjin; Cho, Joy; Ahn, Geun Ho; Javey, Ali Click to show full abstract

Author(s): Zhao, Peida; Wang, Ruixuan; Lien, Der‐Hsien; Zhao, Yingbo; Kim, Hyungjin; Cho, Joy; Ahn, Geun Ho; Javey, Ali

Keywords: scanning probe; monolayer; semiconductors scanning; lithography patterning; monolayer semiconductors; probe lithography

Journal Title: Advanced Materials
Year Published: 2019

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