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This work was funded by National Natural Science Foundation of China (Grant No. 61905236), University of Science and Technology of China (Grant No. KY2100000081), Chinese Academy of Sciences (Grant No.KJ2100230003),… Click to show full abstract
This work was funded by National Natural Science Foundation of China (Grant No. 61905236), University of Science and Technology of China (Grant No. KY2100000081), Chinese Academy of Sciences (Grant No.KJ2100230003), the Fundamental Research Funds for the Central Universities (Grant No. WK2100230020), USTC Research Funds of the Double First-Class Initiative (Grant No. YD3480002002), USTC National Synchrotron Radiation Laboratory (Grant No. KY2100000099) and was partially carried out at the USTC Center for Micro and Nanoscale Research and Fabrication. The authors thank Prof. Binghui Ge from Anhui University for the support of TEM characterization.
Journal Title: Advanced Optical Materials
Year Published: 2020
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