LAUSR

Hydroxyethyl cellulose (HEC) thin films with a molecular weight of 720,000 g/mol deposited by thermal evaporation in a thickness range of 250, 500, and 750 nm were measured in a frequency range of 1–105 Hz and a temperature range of 233–373 K for dielectric characterization with increments of 10 K. Dielectric results were used to derive and evaluate the glass transition temperature and ductility, which are essential parameters for structural analysis. Results showed that the thickness of HEC thin films was an effective parameter on dielectric and structural properties. Because of the increasing thickness, the dielectric constant has values between 22 and 143 at 1 kHz, and glass transition temperature and ductility change between 211–175 K and 15–20, respectively. Based on the literature and the compatible results, the main effect of these variations could be dead layers and voids in structure. The effect of the dead layer gave an important idea about the adjustability of mechanical properties of HEC thin films depending on the thickness. In this way, it would be possible to use these thin films deposited from HEC with 720,000 g/mol molecular weight, especially in drug delivery, electrophoresis technologies, biomedical devices, and coverage applications.