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A graphical method for phase analysis of advanced materials by EDS–SEM was developed and demonstrated on deformed superconducting Bi(Pb)2223 ceramics. Through visual representation, this method allows for the rapid and… Click to show full abstract
A graphical method for phase analysis of advanced materials by EDS–SEM was developed and demonstrated on deformed superconducting Bi(Pb)2223 ceramics. Through visual representation, this method allows for the rapid and efficient analysis of large X‐ray microanalysis datasets and to identify phase composition of fine particles of secondary phases against a background of other phases. The graphical method can be applied using existing software and therefore does not require the development of new programs or complex computations.
Journal Title: Microscopy Research and Technique
Year Published: 2017
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