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The accurate characterization of the effect of conductor surface roughness in microwave transmission lines is crucial in the analysis and design of microwave circuits, in particular at high frequencies. This… Click to show full abstract
The accurate characterization of the effect of conductor surface roughness in microwave transmission lines is crucial in the analysis and design of microwave circuits, in particular at high frequencies. This paper proposes an accurate correction factor based method to calculate the effect of conductor surface roughness from the per‐unit‐length (P.U.L.) parameters and the complex propagation constant of a microstrip line. Then, this correction factor is applied to extract the dielectric properties of microstrip lines, thus taking into account the conductor surface roughness. The simulation results show a good agreement with the given standard values.
Journal Title: Microwave and Optical Technology Letters
Year Published: 2019
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