LAUSR.org creates dashboard-style pages of related content for over 1.5 million academic articles. Sign Up to like articles & get recommendations!

Effective resistance calculation and automated solution for fixing reliability verification violations

Photo by vadutskevich from unsplash

This paper covers the automation done to upgrade the reliability verification in the backend circuit design of microchips. Automation is done to upgrade the reduction of violations which occurs during… Click to show full abstract

This paper covers the automation done to upgrade the reliability verification in the backend circuit design of microchips. Automation is done to upgrade the reduction of violations which occurs during the reliability verification flow by considering each branch or loop resistors and calculating the current through each resistor. It is also estimated that number of straps required particularly for via 3 and via 4 violations so that to reduce number of RV flow execution. Automation is extremely basic in enhancing the proficiency of plan and assembling phases of a VLSI product. This paper gives a flow, which enhances the efficiency of effective resistance thereby improves the proficiency of reliability verification. This reliability verification (RV) analysis flow, can be invoked post Routing of the plan and encourages the VLSI designers to recognize the adjustments in current design, that caused the signal scaling factors (SF)/self-heat violations from past one. This automation essentially decreases SF/self-heat in the circuit by reducing the resistance, in this way decreasing the back end configuration time.

Keywords: reliability; automation; reliability verification; effective resistance

Journal Title: Microsystem Technologies
Year Published: 2018

Link to full text (if available)


Share on Social Media:                               Sign Up to like & get
recommendations!

Related content

More Information              News              Social Media              Video              Recommended



                Click one of the above tabs to view related content.