CaMg2Si3O9 ceramics with low dielectric constant were obtained using the traditional solid-state reaction. Phase analysis, Raman spectroscopy, microstructure, and microwave dielectric properties of the CaMg2Si3O9 at different sintering temperatures were… Click to show full abstract
CaMg2Si3O9 ceramics with low dielectric constant were obtained using the traditional solid-state reaction. Phase analysis, Raman spectroscopy, microstructure, and microwave dielectric properties of the CaMg2Si3O9 at different sintering temperatures were investigated. Only a single phase CaMg2Si3O9, which had the same monoclinic crystal structure as CaMgSi2O6 with a space group of C2/c, was formed in the sintered bodies and no second phases existed in ceramics when sintered at different temperatures. With sintering temperatures from 1200 to 1300 °C, the average grain size of ceramics continuously increased, and the grain size distribution became uniform. The density, Q × f, and the εr values of CaMg2Si3O9 ceramics initially increased and subsequently decreased as the sintering temperature increased. When the sintering was conducted at 1250 °C for 4 h, the CaMg2Si3O9 ceramics showed a maximum bulk density of 3.45 g/cm3 and enhanced microwave dielectric properties of εr = 7.61, Q × f = 41,998 GHz, and τf = − 49.8 ppm/°C.
               
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