Photo from archive.org
We report on the fabrication and characterization of Mo/Au-based transition-edge sensors (TES), intended to be used in X-ray detectors. We have performed complete dark characterization using I–V curves, complex impedance… Click to show full abstract
We report on the fabrication and characterization of Mo/Au-based transition-edge sensors (TES), intended to be used in X-ray detectors. We have performed complete dark characterization using I–V curves, complex impedance and noise measurements at different bath temperatures and biases. Devices with two designs, different sizes and different membranes have been characterized, some of them with a central bismuth absorber. This has allowed extraction of the relevant parameters of the TES, analyses of their standard behavior and evaluation of their prospects.
Journal Title: Journal of Low Temperature Physics
Year Published: 2018
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!