We present critical temperature measurements of titanium thin films annealed in an argon atmosphere at various temperatures. We are able to depress the $${T}_{\text {C}}$$TC by up to 200 mK… Click to show full abstract
We present critical temperature measurements of titanium thin films annealed in an argon atmosphere at various temperatures. We are able to depress the $${T}_{\text {C}}$$TC by up to 200 mK from an initial $${T}_{\text {C}}$$TC of 540 mK by increasing the temperature at which the films are post-annealed from 80 to 275 $$^{\circ }$$∘C. We find an anti-correlation trend between the annealing temperature and the measured $${T}_{\text {C}}$$TC. We also briefly discuss how we plan to use these films to produce TES detectors to be used in the LSPE/SWIPE balloon-borne cosmic microwave background polarimeter, which is slated to launch in December 2019.
               
Click one of the above tabs to view related content.