LAUSR

A series of iron thin films have been deposited under vacuum, by thermal evaporation, onto polycrystalline Cu substrates. The film thickness ranges from 13 to 69 nm. An X-ray diffraction (XRD) technique, working in the ????–2???? mode with the K α Cu radiation (λ = 1.54056 Å), has been used to perform the structural properties. The static magnetic measurements were carried out using a vibrating sample magnetometer (VSM), with the external magnetic field applied parallel and normal to the surface of the films. All the films are polycrystalline and present well-defined Bragg peaks. The easy magnetization axis lies in the film plane for all the samples, and no in-plane magnetic anisotropy has been detected for all films. High values of squareness have been measured in the longitudinal configuration. All the findings will be presented and discussed.