The hysteresis loss of Ni–5 at.%W (Ni5W) substrate contributes considerably to the alternating current (AC) loss of coated conductors (CCs) working at low transporting current or low-frequency field. In the… Click to show full abstract
The hysteresis loss of Ni–5 at.%W (Ni5W) substrate contributes considerably to the alternating current (AC) loss of coated conductors (CCs) working at low transporting current or low-frequency field. In the present work, the evolution of texture and magnetic properties in Ni5W substrates is analyzed and also the relationship between magnetic properties and the extrinsic characteristics (evolved due to the processing techniques) is determined. By making the comparison, we discovered the magnetic domain structures of Ni5W substrates for the first time, achieving a strip/branched domain structures in the recrystallized substrates. The hysteresis loss has been decreased dramatically for the recrystallized substrates. Interestingly, we also observed that this loss is also related to the annealing temperature in the fully recrystallized substrates. The reduced loss can be mainly attributed toward the decrease of grain boundary, which proves the contribution of grain size toward the reduction of hysteresis loss. This result provides a new insight to tailor the hysteresis loss of Ni5W substrates used for coated conductors.
               
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