Chromia scales isothermally grown on pure chromium at 900 °C and a p(O2) of 10−12 atm during 30 min exhibit n- and p-type conduction associated with a duplex morphology with an internal equiaxed… Click to show full abstract
Chromia scales isothermally grown on pure chromium at 900 °C and a p(O2) of 10−12 atm during 30 min exhibit n- and p-type conduction associated with a duplex morphology with an internal equiaxed subscale for an inward (anionic) growth and an external columnar subscale for an outward (cationic) growth. After oxidation exposure, spalled regions in the oxide scale can be observed and have been studied with photoelectrochemical techniques at a mesoscale (probe diameter in the range of 50 µm). Owing to the semiconducting properties of each subscale (bandgap and conduction type), a scenario of spallation is proposed and clarifies when and where the oxide scale spallation occurs.
               
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