A multiscale approach leveraging electron backscatter diffraction (S-EBSD), high resolution EBSD (HR-EBSD), and transmission electron microscopy (TEM) was employed to assess the deformation induced proximate to the crack path by… Click to show full abstract
A multiscale approach leveraging electron backscatter diffraction (S-EBSD), high resolution EBSD (HR-EBSD), and transmission electron microscopy (TEM) was employed to assess the deformation induced proximate to the crack path by hydrogen environment-assisted cracking (HEAC) in peak-aged Monel K-500. Kernel average misorientation (KAM) results calculated from S-EBSD indicate that the deformation pertinent to HEAC is localized to within 25 μ m of the crack path. Geometrically necessary dislocation (GND) density maps calculated from HR-EBSD confirm this localization. The evaluation of the deformation distribution in three separate grains along the crack path using complementary HR-EBSD and TEM suggest a qualitative similarity in dislocation density between the two techniques, though HR-EBSD is unable to spatially resolve the fine dislocation structures observed via TEM. However, non-negligible differences in dislocation patterning were observed in the three evaluated grains, highlighting the importance of a multiscale approach for characterizing deformation to understand the governing microstructural and mechanical factors.
               
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