This work presents a simulation study of the influence of temperature on the performance of dual material gate (DMG) vertical super-thin body (VSTB) FET. The introduction of DMG causes a… Click to show full abstract
This work presents a simulation study of the influence of temperature on the performance of dual material gate (DMG) vertical super-thin body (VSTB) FET. The introduction of DMG causes a drop in the off-state current (I off ) by ~99.18% and DIBL by 20%. Drop in the I off enhances the on-to-off current ratio (I on /I off ) by ~98.85%. A rigorous investigation on temperature dependency of DC, analog/RF, and linearity metrics was carried out. The zero temperature coefficient (ZTC) bias point for the DMG device was observed to be nearly at a gate bias of V G = 0.41 V. Various DC figures of merit (FoM) such as subthreshold swing (SS), I on /I off , and threshold voltage (V T ) show improvement with temperature fall. Lowering in temperature also leads to enhanced analog/RF performance by offering superior g m , g d , C gg , C gd , maximum f T , maximum GBP, intrinsic delay, TGF, TFP, GFP, and GTFP. However, linearity metrics like g m2 , g m3 , VIP2, VIP3, IIP 3 , IMD 3 , and 1-dB compression point show better performance with an increase in temperature.
               
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