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Incipient Fault Diagnosis of Batch Process Based on Deep Time Series Feature Extraction

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Intelligence modeling interpretable for incipient fault diagnosis of batch process represents a serious challenge. For the multivariate, nonlinear, and high-dimensionality characteristics of process data, existing fault diagnosis solutions are easily… Click to show full abstract

Intelligence modeling interpretable for incipient fault diagnosis of batch process represents a serious challenge. For the multivariate, nonlinear, and high-dimensionality characteristics of process data, existing fault diagnosis solutions are easily concealed by noise while neglect the low amplitude and noise interference of the incipient faults. In this paper, an intelligent incipient fault diagnosis model based on deep time series feature extraction network is proposed, which integrates denoising autoencoder (DAE), layer normalization and dropout layer added LSTM (LD-LSTM), and stacked autoencoder (SAE) to obtain the efficient features. DAE is applied to restore the data and eliminate noise interference. LD-LSTM is utilized to extract time series features, in which the layer normalization and the dropout layer are added between the layers of the LSTM to solve the problems of slow model convergence and over-fitting. SAE performs the feature extraction to obtain deep time series features and learns more efficient expressions. The softmax function is applied to achieve the incipient fault diagnosis based on the deep time series features. A case study on a fed-batch penicillin fermentation process suggests that the proposed method can obtain an accuracy rate of 98.97%, which has increased an average of 20% than the traditional shallow machine learning. The accuracy of fault recognition and comparative experiments demonstrate the effectiveness and feasibility of this model, and provide a solution for the application of intelligent fault diagnosis in batch industries.

Keywords: fault diagnosis; incipient; fault; time series

Journal Title: Arabian Journal for Science and Engineering
Year Published: 2021

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