LAUSR

Abstract Topologically close packed phases, among them the μ-phase studied here, are commonly considered as being hard and brittle due to their close packed and complex structure. Nanoindentation enables plastic deformation and therefore investigation of the structure of mobile defects in the μ-phase, which, in contrast to grown-in defects, has not been examined yet. High resolution transmission electron microscopy (HR-TEM) performed on samples deformed by nanoindentation revealed stacking faults which are likely induced by plastic deformation. These defects were compared to theoretically possible stacking faults within the μ-phase building blocks, and in particular Laves phase layers. The experimentally observed stacking faults were found resulting from synchroshear assumed to be associated with deformation in the Laves-phase building blocks.