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Thickness determination of porous Pt cathode thin film capped by atomic layer-deposited alumina for low-temperature solid oxide fuel cells

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Abstract This study investigated the effects of the apparent thickness of porous Pt cathode thin films thermo-mechanically stabilized by an atomic layer-deposited (ALD) alumina capping agent on effective electrical conductivity… Click to show full abstract

Abstract This study investigated the effects of the apparent thickness of porous Pt cathode thin films thermo-mechanically stabilized by an atomic layer-deposited (ALD) alumina capping agent on effective electrical conductivity and electrochemical performance. Four-point probe resistance measurements revealed that a 120 nm-thick porous Pt film exhibits a relatively high electrical conductivity of 9.2 × 103 S/cm. Cathode reaction resistance measurements by means of alternating current impedance spectroscopy (ACIS) analysis show that ALD alumina can act as a thermo-mechanical stabilizer for a 120 nm-thick porous Pt cathode film. The ACIS analysis results for solid oxide fuel cells (SOFCs) with porous Pt cathode thin films of various thicknesses showed that a 120 nm-thick porous Pt cathode film is thermo-mechanically stabilized by the conformal coating of an ALD alumina capping agent. The iR-free polarization curves show that an ALD alumina-capped 120 nm porous Pt cathode film-embedded SOFC delivers ~65% higher power density than an ALD alumina-capped 480 nm-thick porous Pt cathode film-embedded SOFC.

Keywords: ald alumina; atomic layer; cathode; cathode thin; film; porous cathode

Journal Title: Applied Surface Science
Year Published: 2020

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