Abstract The ability to probe tip-sample interactions by Atomic Force Microscopy (AFM) has recently boosted our understanding of the matter at the atomic scale, enabling the study of properties of… Click to show full abstract
Abstract The ability to probe tip-sample interactions by Atomic Force Microscopy (AFM) has recently boosted our understanding of the matter at the atomic scale, enabling the study of properties of surfaces and adsorbates which were previously inaccessible. Nevertheless, this sensitivity to forces presents some drawbacks, as the requirement of a sharp tip apex to prevent the loss of spatial resolution due to the existence of long-range interactions. In this work, we have overcome this long-standing challenge by investigating the controlled extraction of single metallic nanoclusters, selectively grown on graphene. Our results show that the successive extraction of cluster allows to grow nanotips, which minimize the long-range tip-sample interactions and greatly enhance the topographic resolution. We have demonstrated that the created nanotips are very stable, which enables exchanging the sample and using the same nanotip to explore different surfaces without loss of resolution. Since metallic clusters of very different materials and sizes can be grown and selectively extracted by AFM, ours work paves also the way to the specific functionalization of AFM-tips to sense a large variety of interactions.
               
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