LAUSR

Abstract Different thickness MgO thin films were grown on the glass substrate by successive ionic layer adsorption and reaction (SILAR) method as the first study in literature. X-ray diffraction (XRD) measurements demonstrate the cubic MgO structures and samples have (002), and (220) peaks. All film has nanoball structures observed from the scanning electron microscope (SEM) images. The band gap and transmittance values of MgO thin films decrease with increasing thickness. The photoluminescence (PL) spectrum demonstrates that samples have three visible emissions changing with thickness at 381 nm violet emission, 457 nm blue emission and 535 nm green emission. X-ray photoelectron spectroscopy (XPS) spectrum present confirms the elemental signals from carbon (C), oxygen (O) and magnesium (Mg) atoms in the sample. Both Moss and Herve and Vandamme relations refractive index values n , e 0 , and e ∞ values and amount of oxygen increase with raising thickness of MgO thin films.