LAUSR

Abstract La0.67Ca0.33MnO3:Ag0.2 thin films were obtained by pulsed laser deposition followed by post-annealing at 1200 °C for varied durations. Surface morphologies, structures, and electrical and magnetic properties of films prepared with different annealing durations were significantly different. X-ray diffraction results showed that annealed films exhibited stronger diffraction peaks and C-axis preferred growth. Regarding their electrical properties, metal-insulator transition temperature (TMI) and temperature coefficient of resistance (TCR) increased first and then decreased with the increase in annealing duration. In terms of their magnetic properties, thin films displayed ferromagnetic-paramagnetic transition. With the increase in annealing duration, Curie temperature increased first and then decreased. Specifically, the film annealed for 3 h showed excellent electromagnetic properties, with relatively high TCR of 20.3%·K-1 and near room temperature TMI of 285.7 °C. Owing to these excellent properties, as-prepared thin films have application potential in infrared detectors.