Abstract A quantitative determination of chemical and mineral composition at the nanoscale is nowadays fundamental for the knowledge of properties of innovative composite materials. Scanning electron microscopy (SEM) equipped with… Click to show full abstract
Abstract A quantitative determination of chemical and mineral composition at the nanoscale is nowadays fundamental for the knowledge of properties of innovative composite materials. Scanning electron microscopy (SEM) equipped with energy dispersive X-ray spectrometry (EDS) is one of the most commonly employed spatially-resolved analytical methods, because of its versatility and great potential for nano-analysis. However, because of both complex architecture, texture and reduced grain sizes (micro-to-nano) in many composites, to avoid analytical errors, several effects related to electron and X-ray transport in solids must be considered. In the present work, a Monte Carlo SEM-EDS simulation approach is proposed and applied to selected micro-nanosized architectures usually found in composites. The effects of both micro-nanometric grain sizes (100 nm−20 μm) and basic geometrical shapes (cubic, hemicylindrical) of embedded features in the sample matrix (a metal matrix and a glass fibre-reinforced cementitious composite), together with a realistic SEM-EDS setup, were studied. The results evidenced a high dependence of the simulated X-ray spectra versus particles thickness and shape, beam energy and sample-to-detector configuration, which directly affect a correct analytical characterization. The Monte Carlo simulation allowed to investigate and control the physical phenomena affecting the measurement and eventually to determine the optimal SEM-EDS parameters.
               
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