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Conduction mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors

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Abstract The objective of this paper is to present a charge trapping control method for MIM capacitors in which the dielectric is made of electrospray-deposited silica nanoparticles. The influence of… Click to show full abstract

Abstract The objective of this paper is to present a charge trapping control method for MIM capacitors in which the dielectric is made of electrospray-deposited silica nanoparticles. The influence of the bias voltage on the impedance spectra of the devices is analyzed, as well as the main conduction mechanisms along the structure. The control method allows to monitor and control the long term drifts in the impedance of these devices, which are a result of the applied bias voltages.

Keywords: conduction mechanisms; trapping control; control; charge trapping; mim capacitors

Journal Title: Electrochimica Acta
Year Published: 2020

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