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Abstract The ionic liquid [EMIM][TFSI] was investigated by X-ray Photoelectron Spectroscopy (XPS) on different substrates, ranging from metallic to semiconductor type materials. Parallel angle-resolved XPS was performed utilising a wide-angle… Click to show full abstract
Abstract The ionic liquid [EMIM][TFSI] was investigated by X-ray Photoelectron Spectroscopy (XPS) on different substrates, ranging from metallic to semiconductor type materials. Parallel angle-resolved XPS was performed utilising a wide-angle lens hemispherical analyser with an acceptance angle of 60°. ARXPS data show no preferential orientation/accumulation of certain species at the ionic liquid/ultra-high vacuum interface. Charging caused by the electron emission process and electron flood gun experiments was recorded. The data indicate that the binding energies of the spectra depend on the properties of the substrate material, specifically on the substrate/ionic liquid interface. Observations are discussed by means of electric double layer and other processes that may effect on the potential of the ionic liquid.
Journal Title: Journal of Electron Spectroscopy and Related Phenomena
Year Published: 2017
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