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Abstract In this paper a combination of distributed parameter systems and lumped parameter systems is investigated, also known as interconnected system. In particular, the heat distribution and the influence of… Click to show full abstract
Abstract In this paper a combination of distributed parameter systems and lumped parameter systems is investigated, also known as interconnected system. In particular, the heat distribution and the influence of single chips on a base plate is of interest, here in context of insulated-gate bipolar transistors. Only temperature measurements on the base plate are available. A method is presented with which the temperature inside the chip can be estimated. A combination of model reduction and unknown input observer is utilized.
Journal Title: IFAC-PapersOnLine
Year Published: 2020
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