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Abstract Since the introduction of the Z-scan, which is widely used to measure the nonlinear optical properties of material. The result of measurement mainly depends on light through the sample… Click to show full abstract
Abstract Since the introduction of the Z-scan, which is widely used to measure the nonlinear optical properties of material. The result of measurement mainly depends on light through the sample after a slight variation in the intensity, and the tiny change depends on the accuracy of the measurement sensitivity of Z-scan technology. Measurement scheme of the optical signal for nonlinear characterization and transmission beam design can improve the sensitivity of Z-scan technique.
Keywords:
introduction scan;
focus introduction;
scan technique
Journal Title: Optik
Year Published: 2017
Link to full text (if available)
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Journal Title: Optik
Year Published: 2017
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!