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Study a scanning beam current in focusing ion beam device of overcome mirror effect

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Abstract The present work adopted mathematical model used to study the effect the electron beam current on the electron-mirror images. This mathematical model employed to study the characteristics polymer PMMA… Click to show full abstract

Abstract The present work adopted mathematical model used to study the effect the electron beam current on the electron-mirror images. This mathematical model employed to study the characteristics polymer PMMA a through ion mirror effect phenomenon. The results show it is possible to use this model to study an ion mirror effect phenomenon and an electron mirror effect phenomenon alike. Results demonstrated that best understand and interpret for the physical behaviors of a scanning ion may be extracted. Hence can be finding energy safer, which can be used without damage to the sample under study and also can be calculating the required current to reach the surface of the sample for each scanning potential. Furthermore, the mathematical model shows an ability to produce a method for calculating the trapped charge and the maximum stopping potential to disappear the ion mirror effect and accurately excellent.

Keywords: study; mirror effect; effect; ion; mirror; beam

Journal Title: Optik
Year Published: 2018

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