Abstract The paper is dedicated to development of UV emitting scintillating screens for microimaging applications based on the single crystalline films (SCFs) of Ce doped Gd 1− x Lu x… Click to show full abstract
Abstract The paper is dedicated to development of UV emitting scintillating screens for microimaging applications based on the single crystalline films (SCFs) of Ce doped Gd 1− x Lu x AlO 3 and Pr 1 − x Lu x AlO 3 ( x =0–1) multicomponent perovskites grown onto YAlO 3 (YAP) substrates using the liquid phase epitaxy (LPE) method with the objective to improve the X-ray stopping power. Recently Riva et al. [1] have reported that the full set of Gd x Lu 1 − x AlO 3 SCFs with x values in x =0−1.0 range can be crystallized on YAP substrates using this technique. We report here that Pr x Lu 1− x AlO 3 SCFs with x values in x =0–0.5 range can be grown also by the LPE method from PbO-B 2 O 3 flux onto the same YAP substrates. The structural quality of the films was studied using X-ray diffraction. The optical properties of Ce 3+ doped of Gd 1− x Lu x AlO 3 and Pr 1− x Lu x AlO 3 ( x =0−1) multicomponent perovskite films, studied by traditional spectroscopic methods, such as absorption, cathodoluminescence, photoluminescence and light yield measurements under α–particles excitation, are also reported in this work. We have shown that Pb 2+ flux related impurity has significantly larger influence on the light yield of Pr 0.5 Lu 0.5 AlO 3 :Ce, GdAlO 3 :Ce and Gd 0.5 Lu 0.5 AlO 3 :Ce SCFs in comparison with the YAP:Ce and LuAlO 3 :Ce counterparts grown onto YAP substrates.
               
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