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Crystal growth and dislocation etch pits observation of chalcopyrite CdSiP2

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Abstract CdSiP 2 is the only crystal that can offer Non-critical Phase Matching (NCPM) for a 1064 nm pumped optical parametric oscillation (OPO) with idler output in the 6 μm range. In… Click to show full abstract

Abstract CdSiP 2 is the only crystal that can offer Non-critical Phase Matching (NCPM) for a 1064 nm pumped optical parametric oscillation (OPO) with idler output in the 6 μm range. In this paper, a large, crack-free CdSiP 2 single crystal measuring 18 mm in diameter and 65 mm in length was successfully grown by the Vertical Bridgman method (MVB) with an explosion-proof quartz ampoule. The results of lattice parameters, element composition and IR transmittance of the as-grown crystal characterized by X-ray diffraction (XRD), energy dispersive X-ray spectrometer (EDS) and Fourier transformation infrared spectrometer (FTIR) showed the as grown crystal crystallized well and the absorption coefficients at 4878 cm −1 and 2500 cm −1 were 0.14 cm −1 and 0.06 cm −1 . Moreover, a new etchant composed of Br 2 , HCl, HNO 3 , CH 3 OH and H 2 O (1:800:800:400:400 in volume ratio) was prepared and the dislocation etch pits on oriented faces of as-grown CdSiP 2 crystal were observed for the first time. It is found the etch pits are in rectangular structure on the (1 0 1) face, but in trigonal pyramid structure on (3 1 2) face. According to the quantities of the etch pits, the average densities of dislocation were evaluated to be 2.28 × 10 5 /cm 2 and 1.4 × 10 5 /cm 2 , respectively.

Keywords: crystal; dislocation etch; crystal growth; etch pits

Journal Title: Journal of Crystal Growth
Year Published: 2018

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