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Abstract In this work we present the way of ferromagnetic films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra for real time growth… Click to show full abstract
Abstract In this work we present the way of ferromagnetic films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra for real time growth control is described. The method has been successfully tested on Si / SiO 2 / Fe films within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.
Keywords:
ellipsometry;
growth control;
situ magneto;
magneto optical;
optical ellipsometry
Journal Title: Journal of Magnetism and Magnetic Materials
Year Published: 2017
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Journal Title: Journal of Magnetism and Magnetic Materials
Year Published: 2017
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!