Abstract We present spin-polarized scanning tunneling microscopy results for 8 micrometer thick, chromium (0 0 1)-oriented thin films deposited using molecular beam epitaxy on MgO(0 0 1) substrates, achieving a smooth, atomically-stepped staircase morphology.… Click to show full abstract
Abstract We present spin-polarized scanning tunneling microscopy results for 8 micrometer thick, chromium (0 0 1)-oriented thin films deposited using molecular beam epitaxy on MgO(0 0 1) substrates, achieving a smooth, atomically-stepped staircase morphology. The c(2 × 2) surface structure of the Cr(0 0 1) surface was found via atomically-resolved scanning tunneling microscopy images and dI/dV spectroscopy. A practical method of interpreting spin-polarized scanning tunneling microscopy dI/dV images was developed and applied to the c(2 × 2) Cr(0 0 1) surface structure. A 180° spin reversal between atomic layers, characteristic of a topological, layer-wise antiferromagnetic spin structure, was quantitatively verified. In addition, the spin anisotropy directions for 3 different antiferromagnetic, atomic staircase domains occurring on the c(2 × 2) surface were quantitatively determined to coincide with the [1 0 0], [0 1 0], and [1 1 0] crystallographic axes of chromium.
               
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