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Low write current and strong durability in high-speed spintronics memory (spin-Hall MRAM and VoCSM) through development of a shunt-free design process and W spin-Hall electrode

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Abstract We investigated a voltage-control spintronics memory (VoCSM) with a shunt-free design process and W spin-Hall electrode. We successfully reduced the write current to 62 μA at a 5-ns write pulse… Click to show full abstract

Abstract We investigated a voltage-control spintronics memory (VoCSM) with a shunt-free design process and W spin-Hall electrode. We successfully reduced the write current to 62 μA at a 5-ns write pulse (48 μA at a 20-ns write pulse), utilizing a high spin-Hall efficiency by developing the shunt-free design process and optimized W spin-Hall electrode. Moreover, the device was very reliable, exhibiting properties such as a low write error rate ( 1 × 1012 cycles). The spin-Hall MRAM and VoCSM with the shunt-free design process and W spin-Hall electrode could lead to high-speed nonvolatile memory with low power consumption and high durability.

Keywords: spin hall; shunt free; design process; hall electrode; hall; free design

Journal Title: Journal of Magnetism and Magnetic Materials
Year Published: 2019

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