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Magnetic-field-application system at high temperatures for spin-polarized scanning-electron-microscopy measurement

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Abstract To conduct operando measurements, we previously developed a sample-heating system and, for this study, developed a magnetic-field-application system for spin-polarized scanning electron microscopy measurement. A Sm2Co17 permanent magnet placed… Click to show full abstract

Abstract To conduct operando measurements, we previously developed a sample-heating system and, for this study, developed a magnetic-field-application system for spin-polarized scanning electron microscopy measurement. A Sm2Co17 permanent magnet placed below a sample, which works with a resistive heater, is used to apply a magnetic field of more than 20 kA/m perpendicular to a sample at up to 200℃. A specially designed magnetic shield is attached close to the sample to avoid decreasing the accuracy of secondary polarization detection due to the stray field from the magnet. With this system, we observed the reformation of a magnetic domain structure of Fe (100) at 200℃ by applying a magnetic field of 20 kA/m.

Keywords: application system; field application; microscopy; field; magnetic field

Journal Title: Journal of Magnetism and Magnetic Materials
Year Published: 2021

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