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Abstract The role of grain topology as a predictor on abnormal grain growth (AGG) of primary recrystallized silicon steel sheet has been investigated by EBSD technique. Goss oriented grains in… Click to show full abstract
Abstract The role of grain topology as a predictor on abnormal grain growth (AGG) of primary recrystallized silicon steel sheet has been investigated by EBSD technique. Goss oriented grains in the primary recrystallized silicon steel sheet were observed to have larger grain sizes than average matrix grains. The average grain size of grains with the smallest deviation angle (
Keywords:
ebsd;
steel;
grain growth;
grain;
abnormal grain
Journal Title: Materials Characterization
Year Published: 2020
Link to full text (if available)
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Journal Title: Materials Characterization
Year Published: 2020
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!