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Abstract Analog circuits are often challenging to debug with dynamic laser stimulation (DLS) due to intrinsic sensitivity of some circuitries to carrier generations. This paper showcases successful post‑silicon debug on… Click to show full abstract
Abstract Analog circuits are often challenging to debug with dynamic laser stimulation (DLS) due to intrinsic sensitivity of some circuitries to carrier generations. This paper showcases successful post‑silicon debug on analog circuitries (start-up circuit) using nanosecond pulse-on-demand laser to perform Time-resolved Dynamic Laser Stimulation (TR-DLS), leading into root cause identification on a marginality issue in a sub-20 nm FinFET technology device.
Keywords:
analog circuit;
dls analysis;
analysis analog;
dls;
analog
Journal Title: Microelectronics Reliability
Year Published: 2020
Link to full text (if available)
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Journal Title: Microelectronics Reliability
Year Published: 2020
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!