LAUSR

Abstract This work analyses the conducted electromagnetic interference (EMI) immunity of the Cortex-M4 processor as function of aging. With this purpose, voltage dips were injected in the VDD input power pins of the processor as ruled by the IEC 61000–4-29 standard, whereas aging test was performed by means of the 1015.9 Burn-In Part of the Method MIL-STD-833E. After 456 h of burn-in at 125 °C, the processor presented a current increase in excess of 2.36% and conducted EMI immunity degradation in the order of 158% for the processor operating at extremely low voltage. If the processor is running in the manufacturer's recommended operating voltage range, then such degradation turns into 38%. Moreover, it was measured negligible performance degradation according to the Dhrystone V2.1a benchmark.