There are several methods to focus light behind a scattering medium, but very few use fluorescence light as feedback or can be used without access to the distal side of… Click to show full abstract
There are several methods to focus light behind a scattering medium, but very few use fluorescence light as feedback or can be used without access to the distal side of the scatterer. Among all the wave-front shaping techniques, retrieving the transmission matrix of a scattering material is the only one that allows for focusing on multiple spots after a single set of measurements. Here we propose a method to retrieve the transmission matrix of a scatterer using fluorescence light as feedback without access to the distal side. The advantage of this method is that it allows focusing on the whole field of view after a single matrix measurement without affecting the sample, making it suitable for reflection epi-illumination geometry microscopy.
               
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