LAUSR

Abstract The increasing number of solution-processed laser compounds that can be implemented as low-cost, flexible, and/or integrated devices, makes necessary the development of reliable methods to delineate all their amplifying signatures and thus to open the door to appropriate cross-sample comparisons. Seeking to solve this problem, a new formalism to retrieve the losses and the optical gains from Amplified Spontaneous Emission (ASE) spectra as a function of the excitation density has been recently reported. In this manuscript, we explore the potential of this methodology to unveil relevant information on the photonic properties of the waveguiding devices and on the photophysics of the active materials. We demonstrate that the Variable Pump Intensity method opens the door to understand the relationship between the ASE thresholds and the optical gains and losses, it enables the extraction of the scattering/modal losses of the passive devices, and it can unveil the presence of leaky-modes and excited state absorption. In contrast, it does not perform too well in samples with multiple active species in its current implementation. We have substantiated all these findings using organic semiconductor thin films, several dye-doped polymer thin films and solutions of boron hydride.