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Recovering effective thicknesses and optical properties of copper and copper oxide layers from absorbance measurements

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Abstract Nowadays, the recovering of both thicknesses and optical properties of nanometric multilayers is still a challenge. We propose a method to recover the effective relative permittivities and the thicknesses… Click to show full abstract

Abstract Nowadays, the recovering of both thicknesses and optical properties of nanometric multilayers is still a challenge. We propose a method to recover the effective relative permittivities and the thicknesses of copper/copper oxide layers, from absorbance spectra measured in the visible spectra. The experimental data are fitted with a model of classical light-matter interaction and a combination of two Drude-Lorentz laws to calculate the relative permittivities over the spectrum. The Particle Swarm Optimization and the evolutionary methods are used for the least-square fitting. A two steps study reveals that the relative permittivities of bulk cannot be used to fit adequately the absorbance curves. However, a perturbation of these reference values improves their fitting. The method is applied to the absorption spectra of a set of three copper samples that are progressively oxidized by six successive heat treatments.

Keywords: copper oxide; oxide layers; copper; copper copper; optical properties; thicknesses optical

Journal Title: Optical Materials
Year Published: 2019

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