LAUSR

Abstract The paper reports on a semi-automatic method for the detection and analysis of ion-etch pits generated on Solid State Nuclear Track Detectors (SSNTD) of the CR39 type. The CR39 detectors have been exposed to the elastically scattered Cun+ ions on a 50 nm Au layer deposited on a silicon substrate. After irradiations, foils have been chemically etched for 2 h in a 6.25 M NaOH solution to develop the ion-induced latent tracks. The detectors' surfaces have been analysed by Optical Microscopy (OM) and studied with the proposed method based on the measurements of both diameter and mean gray value of the ion-etched pits. The results are motivated by the future applications of these polymeric foils in the detection of charged particles in “harsh” environments, characterized by high dose and high radiation damage, e.g., in fusion experiments or in the diagnostic of plasma generated by lasers. A strong correlation between tracks’ characteristics (diameter and grayness) and the energy of the backscattered Cu ions has been obtained and empirical relationships between them are presented.