Abstract The Fano resonance photoemission study of the Pb0.97Ge0.03Te crystal doped by sequential deposition of Sm atoms on the clean [111] surface was performed to determine the contribution of the… Click to show full abstract
Abstract The Fano resonance photoemission study of the Pb0.97Ge0.03Te crystal doped by sequential deposition of Sm atoms on the clean [111] surface was performed to determine the contribution of the Sm4f electrons to the valence band of the Pb0.97Ge0.03Te/Sm crystal and to monitor the process of introduction of Sm into the substrate crystal host lattice. After each deposition step and after subsequent thermal treatment the contribution of both Sm2+ and Sm3+ ions were assessed. The analysis of the acquired data and a comparison with the results of similar studies of Sm doped CdTe, ZnO and GaN show that the thermal treatment at 250 °C of the Sm/Pb0.97Ge0.03Te system leads to conversion of Sm2+ to Sm3+ and probably to Sm4+ which corresponds to the valence of the cations in the substrate crystal host lattice.
               
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