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Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloy

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Abstract Hot compression tests of Cu-Ni-Si alloy with high Ni and Si contents were performed at the deformation temperatures of 750–950 °C, and the strain rates of 0.01–10 s−1 on a Gleeble-3800… Click to show full abstract

Abstract Hot compression tests of Cu-Ni-Si alloy with high Ni and Si contents were performed at the deformation temperatures of 750–950 °C, and the strain rates of 0.01–10 s−1 on a Gleeble-3800 thermo-mechanical simulator. The critical conditions for dynamic recrystallization (DRX) of Cu-Ni-Si alloy were obtained by processing the collected data and combining with the inflection point of θ-σ curve with the minimum value criterion of −∂θ/∂σ-σ curve. There was a certain correlation between the critical strain (ec) and the peak strain (ep), that was, ec/ep = 0.723, and the functional relationship between ec and Z parameter was ec = 1.05 × 10−3Z0.059. The average recrystallized grain size under various deformation conditions was measured, and the DRX grain growth model of Cu-Ni-Si alloy was established as dDRX = 5650.4 e −0.12891exp(−73142/RT).

Keywords: dynamic recrystallization; critical conditions; grain growth; growth model

Journal Title: Results in physics
Year Published: 2019

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