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Metallic interface induced by electronic reconstruction in crystalline-amorphous bilayer oxide films

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https://doi.org/10.1016/j.scib.2019.08.026 2095-9273/ 2019 Science China Press. Published by Elsevier B.V. and Science China Press. All rights reserved. ⇑ Corresponding authors. E-mail addresses: [email protected] (X. Lü), [email protected] (Q. Jia). Xujie Lü… Click to show full abstract

https://doi.org/10.1016/j.scib.2019.08.026 2095-9273/ 2019 Science China Press. Published by Elsevier B.V. and Science China Press. All rights reserved. ⇑ Corresponding authors. E-mail addresses: [email protected] (X. Lü), [email protected] (Q. Jia). Xujie Lü a,⇑, Aiping Chen , Yaomin Dai , Bin Wei , Hongwu Xu , Jianguo Wen , Nan Li , Yongkang Luo , Xiang Gao , Erik Enriquez , Zhongchang Wang , Paul Dowden , Wenge Yang , Yusheng Zhao , Quanxi Jia i,j,⇑

Keywords: interface induced; metallic interface; induced electronic; crystalline amorphous; electronic reconstruction; reconstruction crystalline

Journal Title: Science Bulletin
Year Published: 2019

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