LAUSR

Abstract In this paper, we study the role of creep deformation arising from electrochemical charging and discharging on the mechanical resilience of bilayer electrode. For this purpose, a new theoretical model incorporating Li diffusion, creep deformation, and induced stress is proposed. The results indicate that the diffusion-induced creep is an important mechanism for stress relaxation and capacity enhancement in Sn-based bilayer electrode. In addition, owing to the introduction of creep, the resultant stress should be dictated by the interplay between time scale associated with diffusion, applied flux and creep relaxations.