LAUSR

Abstract Comprehensive studies were carried out to explore the roles of phenyl-C 61 -butyric acid methyl ester (PCBM) thin films in inverted-type CH 3 NH 3 PbI 3 (MAPbI 3 ) based photovoltaics, including the surface morphologies, transmittance spectra, photoluminescence spectra, X-ray diffraction (XRD) patterns, Raman scattering spectra and thin-film residual stress analysis. The reduction in the photoluminescence line width indicates that the crystallinity of the MAPbI 3 thin film can be increased by covering it with the PCBM thin film. The XRD patterns and Raman scattering spectra show a reduction in the compressive stress of MAPbI 3 thin film when covered by the PCBM thin film. In addition, it is noted that the residual stress at the contact interface between the hydrophilic MAPbI 3 and the hydrophobic PCBM can be ignored as confirmed by the results obtained with a home-made Twyman-Green interferometer. Consequently, the superior optoelectronic properties of the perovskite materials, as well as the use of a multifunctional fullerene-based thin film as the capping layer allow for the high-efficiency perovskite photovoltaics.