Abstract In the majority of studies involving injection dependent lifetime spectroscopy, it is assumed that the investigated defect is a single-level defect following Shockley-Read-Hall recombination statistics. Nevertheless, in real life,… Click to show full abstract
Abstract In the majority of studies involving injection dependent lifetime spectroscopy, it is assumed that the investigated defect is a single-level defect following Shockley-Read-Hall recombination statistics. Nevertheless, in real life, two-level defects or multi-level defects are more common than single-level defects. In this study, we first investigated the possible consequences of misinterpreting a two-level defect as two single-level defects. A procedure to properly fit two-level defects in lifetime spectroscopy is subsequently proposed. At the end, we use boron-oxygen related defects as an experimental demonstration. Our experimental results reveal that the recombination statistics of boron-oxygen related defects cannot be explained by the coexistence of two independent single-level defects. A two-level defect parameterization appears to be more suitable.
               
Click one of the above tabs to view related content.