Abstract Zn0.99Mn0.01O thin films were deposited on borosilicate glass at different temperatures and precursor concentration using cost-effective chemical spray pyrolysis. X-ray diffraction patterns revealed that all the deposits had a… Click to show full abstract
Abstract Zn0.99Mn0.01O thin films were deposited on borosilicate glass at different temperatures and precursor concentration using cost-effective chemical spray pyrolysis. X-ray diffraction patterns revealed that all the deposits had a hexagonal wurtzite structure with (0 0 2) preferred orientation. The variation of deposition temperature and precursor concentration slightly modified the crystallite size and lattice parameters. The compositional analysis by Energy dispersive X-ray analysis indicated the presence of zinc and manganese. The films deposited at 723 K using 0.0125 M precursor exhibited ~90% transmittance in the visible region. The optical energy band-gap reduced when both deposition temperature and solution molarity were increased probably due to sp-d exchange interactions. All deposited films showed two emission peaks that is near band edge and deep level emissions in ultraviolet and visible region respectively. All films showed n-type electrical conductivity. The observed changes were due to the variation in charge carrier density and mobility in the films. Low-temperature magnetic studies showed that the films were super-paramagnetic when deposited using low precursor concentration while they were weakly ferromagnetic when deposited using higher precursor concentration.
               
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