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Microscopic charge fluctuations cause minimal contrast loss in cryoEM

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Highlights • A physical account of charge fluctuations in low-dose cryoEM is presented.• We quantify the bee swarm charging phenomenon on cryoEM specimen.• We measure the envelope function caused by… Click to show full abstract

Highlights • A physical account of charge fluctuations in low-dose cryoEM is presented.• We quantify the bee swarm charging phenomenon on cryoEM specimen.• We measure the envelope function caused by charge fluctuations.• The effects of these fluctuations are negligible in cryoEM.

Keywords: cryoem; cause minimal; fluctuations cause; charge fluctuations; microscopic charge

Journal Title: Ultramicroscopy
Year Published: 2018

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